Fabrication of [001]-oriented tungsten tips for high resolution scanning tunneling microscopy

نویسندگان

  • A. N. Chaika
  • N. N. Orlova
  • V. N. Semenov
  • E. Yu. Postnova
  • S. A. Krasnikov
  • M. G. Lazarev
  • S. V. Chekmazov
  • V. Yu. Aristov
  • V. G. Glebovsky
  • S. I. Bozhko
  • I. V. Shvets
چکیده

The structure of the [001]-oriented single crystalline tungsten probes sharpened in ultra-high vacuum using electron beam heating and ion sputtering has been studied using scanning and transmission electron microscopy. The electron microscopy data prove reproducible fabrication of the single-apex tips with nanoscale pyramids grained by the {011} planes at the apexes. These sharp, [001]-oriented tungsten tips have been successfully utilized in high resolution scanning tunneling microscopy imaging of HOPG(0001), SiC(001) and graphene/SiC(001) surfaces. The electron microscopy characterization performed before and after the high resolution STM experiments provides direct correlation between the tip structure and picoscale spatial resolution achieved in the experiments.

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عنوان ژورنال:

دوره 4  شماره 

صفحات  -

تاریخ انتشار 2014